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Shin, Daun
1
results:
Bookchapter (Online) X
?
1
A Study on the Application of Technical Assessment Methodol..:
, In:
Proceedings of the 2020 ACM International Conference on Intelligent Computing and its Emerging Applications
,
Jung, Daun
;
Shin, Jiho
;
Lee, Chaechang
.. - p. 1-7 , 2020
Link:
https://dl.acm.org/doi/1..
1-1
