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X
Wang, Sheldon
53  results:
Bookchapter (Online) X
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1

Overseas development for a major U.S. eCommerce website:

, In: Proceedings of the 28th international conference on Software engineering,
Wu, Jiang ; Wang, Sheldon ; Chau, Christine.. - p. 632-635 , 2006
Link: https://dl.acm.org/doi/1..
 
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2

Contributors:

, In: Biomechanics of Coronary Atherosclerotic Plaque,
Akyildiz, Ali C. ; Antoniadis, Antonios P. ; Athanasiou, Lambros S.... - p. xix-xxiv , 2021
Link: https://doi.org/10.1016/..
 
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3

List of Contributors:

, In: Chronic Renal Disease,
Abramovitz, Blaise ; Adu, Dwomoa ; Afshinnia, Farsad... - p. xiii-xvii , 2020
Link: https://doi.org/10.1016/..
 
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4

Introduction:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 279-304 , 2019
Link: https://doi.org/10.1007/..
 
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5

Learning-Based DRM and Energy Optimization for Manycore Dar..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 217-245 , 2019
Link: https://doi.org/10.1007/..
 
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6

Aging-Aware Timing Analysis:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 305-321 , 2019
Link: https://doi.org/10.1007/..
 
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7

Introduction:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 3-12 , 2019
Link: https://doi.org/10.1007/..
 
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8

Physics-Based EM Modeling:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 13-45 , 2019
Link: https://doi.org/10.1007/..
 
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9

Fast EM Stress Evolution Analysis Using Krylov Subspace Met..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 47-66 , 2019
Link: https://doi.org/10.1007/..
 
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10

Reducing Processor Wearout by Exploiting the Timing Slack o..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 439-455 , 2019
Link: https://doi.org/10.1007/..
 
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11

Aging-Aware Standard Cell Library Optimization Methods:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 323-342 , 2019
Link: https://doi.org/10.1007/..
 
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12

EM Assessment for Power Grid Networks:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 153-175 , 2019
Link: https://doi.org/10.1007/..
 
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13

Cross-Layer DRM and Optimization for Datacenter Systems:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 263-275 , 2019
Link: https://doi.org/10.1007/..
 
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14

Compact EM Models for Multi-Segment Interconnect Wires:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 121-151 , 2019
Link: https://doi.org/10.1007/..
 
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15

Resource-Based EM Modeling DRM for Multi-Core Microprocesso..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 177-194 , 2019
Link: https://doi.org/10.1007/..
 
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