E-LIB Suche - Ergebnisse für: Agarwal, Akshay

1

Shot noise-mitigated secondary electron imaging with ion co..:

Agarwal, Akshay ; Kasaei, Leila ; He, Xinglin...
Proceedings of the National Academy of Sciences. 121 (2024) 31 - p. , 2024

Link: https://doi.org/10.1073/..

2

Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mit..:

Agarwal, Akshay ; Kasaei, Leila ; He, Xinglin...
Microscopy and Microanalysis. 30 (2024) Supplement_1 - p. , 2024

Link: https://doi.org/10.1093/..

3

Deepfake: Classifiers, Fairness, and Demographically Robust..:

, In: 2024 IEEE 18th International Conference on Automatic Face and Gesture Recognition (FG),

Agarwal, Akshay ; Ratha, Nalini - p. 1-9 , 2024

Link: https://doi.org/10.1109/..

4

Corruption depth: Analysis of DNN depth for misclassificati..:

Agarwal, Akshay ; Vatsa, Mayank ; Singh, Richa.
Neural Networks. 172 (2024) - p. 106013 , 2024

Link: https://doi.org/10.1016/..

5

Indian Traffic Sign Detection and Classification Through a ..:

Uikey, Rishabh ; Lone, Haroon R. ; Agarwal, Akshay
IEEE Transactions on Intelligent Transportation Systems. , 2024

Link: https://doi.org/10.1109/..

6

Misclassifications of Contact Lens Iris PAD Algorithms: Is ..:

, In: 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV),

Agarwal, Akshay ; Ratha, Nalini ; Noore, Afzel.. - p. 961-970 , 2023

Link: https://doi.org/10.1109/..

7

IBAttack: Being Cautious About Data Labels:

Agarwal, Akshay ; Singh, Richa ; Vatsa, Mayank.
IEEE Transactions on Artificial Intelligence. 4 (2023) 6 - p. 1484-1493 , 2023

Link: https://doi.org/10.1109/..

8

Unveiling a rare radiological discovery: Interlobar pneumot..:

Sharma, Shorabh ; Khatri, Shivam ; Agarwal, Akshay...
Radiology Case Reports. 18 (2023) 9 - p. 2955-2959 , 2023

Link: https://doi.org/10.1016/..

9

Attention Guided Multi-attribute Architecture For Deepfake ..:

, In: 2023 IEEE Western New York Image and Signal Processing Workshop (WNYISPW),

Sharma, Rohan ; Jawade, Bhavin ; Agarwal, Akshay.. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

10

Secondary electron count imaging in SEM:

Agarwal, Akshay ; Simonaitis, John ; Goyal, Vivek K..
Ultramicroscopy. 245 (2023) - p. 113662 , 2023

Link: https://doi.org/10.1016/..

11

Parameter agnostic stacked wavelet transformer for detectin..:

Agarwal, Akshay ; Vatsa, Mayank ; Singh, Richa.
Information Fusion. 95 (2023) - p. 415-425 , 2023

Link: https://doi.org/10.1016/..

12

Fourier-ring Correlation Resolution for Time-resolved Measu..:

Hitit, Oguz Kagan ; Agarwal, Akshay ; Goyal, Vivek
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 730-731 , 2023

Link: https://doi.org/10.1093/..

13

Continuous-Time Modeling and Analysis of Particle Beam Metr..:

Agarwal, Akshay ; Peng, Minxu ; Goyal, Vivek K
IEEE Journal on Selected Areas in Information Theory. 4 (2023) - p. 61-74 , 2023

Link: https://doi.org/10.1109/..

14

Progress in Secondary Electron Yield Mapping in Charged Par..:

Agarwal, Akshay ; Kasaei, Leila ; Schultz, Albert..
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 741-742 , 2023

Link: https://doi.org/10.1093/..

15

Benchmarking Robustness Beyond $$l_p$$ Norm Adversaries:

, In: Lecture Notes in Computer Science; Computer Vision – ECCV 2022 Workshops,

Agarwal, Akshay ; Ratha, Nalini ; Vatsa, Mayank. - p. 342-359 , 2023

Link: https://doi.org/10.1007/..