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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
5
RESURF Region Variation Induced Current Crowding Effect on ..:
, In:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
7
A Combination of Implant Shadow and Skin Effects Leading to..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
8
Transmission Line Pulse Width Impacting on Device Performan..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
11
Bipolar Transistors' Holding Phenomena:
, In:
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2022 IEEE International Conference on Consumer Electronics - Taiwan ,
14