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2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
1
Can IOT make semiconductor great again?:
, In:
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2016 21th IEEE European Test Symposium (ETS) ,
2
Is IoT coming to the rescue of semiconductor?:
, In:
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ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753) ,
9