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2021 43rd Annual EOS/ESD Symposium (EOS/ESD) ,
10
HBM and CDM ESD Performance of Advanced Silicon Photonic Co..:
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2020 IEEE International Integrated Reliability Workshop (IIRW) ,
12
On the impact of Gate field-plate length and barrier layer ..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
13
A Compact Physics Analytical Model for Hot-Carrier Degradat..:
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2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ,
15