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Nellist, P D
474
results:
Format
Online (474)
Mediatypes
Articles (Online) (161)
OpenAccess-fulltext (313)
Sorted by: Relevance
Sorted by: Year
?
1
Combine 4D STEM and EELS Using a Fast Pixelated Direct Dete..:
Huth, M
;
Eckert, B
;
Aschauer, S
...
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 401-402 , 2023
Link:
https://doi.org/10.1093/..
?
2
Aberration-corrected scanning transmission electron microsc..:
Pennycook, S. J.
;
Lupini, A. R.
;
Kadavanich, A.
...
International Journal of Materials Research. 94 (2022) 4 - p. 350-357 , 2022
Link:
https://doi.org/10.1515/..
?
3
Applications of Low Dose Electron Ptychography:
Kirkland, AI
;
Kim, J S
;
Allen, C S
...
Microscopy and Microanalysis. 28 (2022) S1 - p. 352-354 , 2022
Link:
https://doi.org/10.1017/..
?
4
Phase reconstruction using fast binary 4D STEM data:
O'Leary, C. M.
;
Allen, C. S.
;
Huang, C.
...
Applied Physics Letters. 116 (2020) 12 - p. , 2020
Link:
https://doi.org/10.1063/..
?
5
The atomic lensing model: New opportunities for atom-by-ato..:
van den Bos, K.H.W.
;
Janssens, L.
;
De Backer, A.
..
Ultramicroscopy. 203 (2019) - p. 155-162 , 2019
Link:
https://doi.org/10.1016/..
?
6
Focused-Probe STEM Ptychography: Reconstruction Methods, Tr..:
Nellist, P D
;
Martinez, G T
;
Leary, C O'
...
Microscopy and Microanalysis. 24 (2018) S1 - p. 488-489 , 2018
Link:
https://doi.org/10.1017/..
?
7
4D Analytical STEM with the pnCCD:
Huth, M.
;
Simson, M.
;
Ritz, R.
...
Microscopy and Microanalysis. 24 (2018) S1 - p. 220-221 , 2018
Link:
https://doi.org/10.1017/..
?
8
Single Atom Detection from Low Contrast-to-Noise Ratio Elec..:
Fatermans, J.
;
den Dekker, A. J.
;
Müller-Caspary, K.
...
Physical Review Letters. 121 (2018) 5 - p. , 2018
Link:
https://doi.org/10.1103/..
?
9
Exploring the Limits of Focused-Probe STEM Ptychography:
Nellist, P. D.
;
Martinez, G. T.
;
O'Leary, C.
.
Microscopy and Microanalysis. 24 (2018) S1 - p. 190-191 , 2018
Link:
https://doi.org/10.1017/..
?
10
Thickness dependence of scattering cross-sections in quanti..:
Martinez, G.T.
;
van den Bos, K.H.W.
;
Alania, M.
..
Ultramicroscopy. 187 (2018) - p. 84-92 , 2018
Link:
https://doi.org/10.1016/..
?
11
An optical configuration for fastidious STEM detector calib..:
JONES, L.
;
VARAMBHIA, A.
;
SAWADA, H.
.
Journal of Microscopy. 270 (2018) 2 - p. 176-187 , 2018
Link:
https://doi.org/10.1111/..
?
12
Three-dimensional atomic models from a single projection us..:
De Backer, A.
;
Jones, L.
;
Lobato, I.
...
Nanoscale. 9 (2017) 25 - p. 8791-8798 , 2017
Link:
https://doi.org/10.1039/..
?
13
Excited helium under high pressures in the bulk and in nano..:
Pyper, N. C.
;
Naginey, T. C.
;
Nellist, P. D.
.
Philosophical Magazine Letters. 97 (2017) 8 - p. 295-303 , 2017
Link:
https://doi.org/10.1080/..
?
14
Using Advanced STEM Techniques to Unravel Key Issues in the..:
Lozano, J. G.
;
Liberti, E.
;
Luo, K.
...
Microscopy and Microanalysis. 23 (2017) S1 - p. 1698-1699 , 2017
Link:
https://doi.org/10.1017/..
?
15
Evaluation of Aberration-corrected Optical Sectioning for E..:
Hernandez-Maldonado, D.
;
Groger, R.
;
Ramasse, Q. M.
..
Microscopy and Microanalysis. 23 (2017) S1 - p. 432-433 , 2017
Link:
https://doi.org/10.1017/..
1-15