Ohshima, T.
1479  results:
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7

Voltage Dependence of Single-Event Cross Sections of FinFET..:

Takeuchi, K. ; Sakamoto, K. ; Yukumatsu, K....
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1755-1759 , 2023
 
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Soft- and Hard-Error Radiation Reliability of 228 KB $3\mat..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Takahashi, H. ; Okamoto, Y. ; Hamada, T.... - p. 1-6 , 2023
 
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