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2022 IEEE International Reliability Physics Symposium (IRPS) ,
12
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:
, In:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
14
STT-MRAM Product Reliability and Cross-Talk:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
15