Wei, K.
~ 800  results:
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1

Defect location of power cables by frequency domain reflect..:

, In: 2022 Annual Meeting of CSEE Study Committee of HVDC and Power Electronics (HVDC 2022),
Li, Q. ; Zhao, J. ; Lui, Y.... - p. None , 2022
 
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2

A Review of Asset Administration Shell:

, In: 2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM),
Wei, K. ; Sun, J. Z. ; Liu, R. J. - p. 1460-1465 , 2019
 
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3

A compact model of resistive switching devices:

, In: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology,
Chen, B. ; Jun, Q.Y. ; Gao, B.... - p. 1829-1831 , 2010
 
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4

Numerical Investigation on the Seismic Responses of the Men..:

, In: Lecture Notes in Civil Engineering; Numerical Analysis of Dams,
Fu, Z. Z. ; Mi, Z. K. ; Wei, K. M. - p. 485-500 , 2020
 
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5

Splay trees for data compression:

, In: Proceedings of the sixth annual ACM-SIAM symposium on Discrete algorithms,
 
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6

A Microfluidic Chip for Screening High-Producing Hybridomas..:

, In: 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS),
Zhang, Wei K. ; Li, Ren ; Fang, Zhi G.... - p. 422-425 , 2019
 
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7

Genetic Algorithm Feature Selection and Classifier Optimiza..:

, In: 2013 1st International Conference on Artificial Intelligence, Modelling and Simulation,
 
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8

Contributors:

, In: Nanobiotechnology for Food Processing andPackaging,
 
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10

List of contributors:

, In: Inoculating Cities,
 
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11

Nanobiotechnological utility for the removal of food contam..:

, In: Nanobiotechnology for Food Processing andPackaging,
 
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12

Contributors:

, In: Treatments, Nutraceuticals, Supplements, and Herbal Medicine in Neurological Disorders,
Abdi, Sadaf ; Ahmad, Irshad ; Ali, Hussain... - p. xxxi-xlii , 2023
 
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13

Research on the application of visible light modeling techn..:

, In: Annual Meeting of CSEE Study Committee of HVDC and Power Electronics (HVDC 2023),
Liu, C. ; Zhong, W. ; Wei, Y.... - p. None , 2023
 
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14

NTIRE 2023 Image Shadow Removal Challenge Report:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
 
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15

Airgap Integration on Patterned Metal Lines for Advanced In..:

, In: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM),
Chang, H.K. ; Huang, H.Y. ; Lo, T.Y... - p. 1-4 , 2023
 
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