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Lo, Yi-Hao
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1

Exploiting Library Vulnerability via Migration Based Automa..:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Chen, Zirui ; Hu, Xing ; Xia, Xin... - p. 2820-2831 , 2024
Link: https://doi.org/10.1145/..
 
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2

MUT: Human-in-the-Loop Unit Test Migration:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Gao, Yi ; Hu, Xing ; Xu, Tongtong... - p. 2832-2843 , 2024
Link: https://doi.org/10.1145/..
 
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3

Case Classification System Based on Taiwanese Civil Summary..:

, In: Frontier Computing on Industrial Applications Volume 4; Lecture Notes in Electrical Engineering,
Chen, Ming-Yi ; Chang, Jia-Wei ; Lo, Hsiao-Chin. - p. 66-76 , 2024
Link: https://doi.org/10.1007/..
 
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4

Improving Interoperability in Healthcare: A User-Friendly I..:

, In: Lecture Notes in Electrical Engineering; Frontier Computing on Industrial Applications Volume 3,
Yen, Lo-Hsien ; Huang, Tzu-Ting ; Hsu, Chien -Yeh... - p. 326-335 , 2024
Link: https://doi.org/10.1007/..
 
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5

Exploiting Library Vulnerability via Migration Based Automa..:

, In: Proceedings of the IEEE/ACM 46th International Conference on Software Engineering,
Chen, Zirui ; Hu, Xing ; Xia, Xin... - p. 1-12 , 2024
Link: https://dl.acm.org/doi/1..
 
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6

MUT: Human-in-the-Loop Unit Test Migration:

, In: Proceedings of the IEEE/ACM 46th International Conference on Software Engineering,
Gao, Yi ; Hu, Xing ; Xu, Tongtong... - p. 1-12 , 2024
Link: https://dl.acm.org/doi/1..
 
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7

Advanced Chip on Wafer Hybrid Bonding with Copper/Polymer B..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Ouyang, Tsung- Yu ; Lin, Yu-Min ; Chan, Yu-Ping... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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8

Fine Pitch and Low Temperature Nanocrystalline-Nanotwinned ..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Chiu, Wei-Lan ; Lee, Ou-Hsiang ; Chang, Hsiang-Hung... - p. 319-324 , 2024
Link: https://doi.org/10.1109/..
 
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9

Restoration Strategies for the Radiation Pattern of a 5G mm..:

, In: 2024 IEEE International Workshop on Antenna Technology (iWAT),
Sim, Chow-Yen-Desmond ; Liu, Ting-Jia ; Kao, Huang-Yi.. - p. 334-336 , 2024
Link: https://doi.org/10.1109/..
 
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10

Effect of Passivation on BEOL-Compatible Oxide Semiconducto..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Kuo, Chi-Yuan ; Lo, Tsung-Tien ; Chiu, Yun-Ping... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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11

Self-Admitted Technical Debts Identification: How Far Are W..:

, In: 2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER),
Gu, Hao ; Zhang, Shichao ; Huang, Qiao... - p. 804-815 , 2024
Link: https://doi.org/10.1109/..
 
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12

34.8 A 22nm 16Mb Floating-Point ReRAM Compute-in-Memory Mac..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Wen, Tai-Hao ; Hsu, Hung-Hsi ; Khwa, Win-San... - p. 580-582 , 2024
Link: https://doi.org/10.1109/..
 
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13

Development of an Artificial Intelligence-Based Precise Nut..:

, In: Lecture Notes in Electrical Engineering; Frontier Computing on Industrial Applications Volume 3,
Liu, Chen-Yi ; Wu, Pin-Hua ; Lee, Hsiu-An... - p. 336-344 , 2024
Link: https://doi.org/10.1007/..
 
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14

U-MRAM PUF: A Novel Unipolar-MRAM for Power and Area Effici..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Shih, Ching ; Hong, Ming-Chun ; Wang, Chih-Yao... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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15

200mm GaN-on-Si E-Mode Power HEMTs with Epitaxially Grown p..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Huang, Zhen-Hong ; Chang, Chia-Hao ; Lo, Ting-Chun... - p. 319-322 , 2024
Link: https://doi.org/10.1109/..
 
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