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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
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Development of a GAGG prompt gamma camera and simultaneous ..:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
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Simulation evaluation of uncertainty of estimated ranges fo..:
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2023 IEEE 12th Global Conference on Consumer Electronics (GCCE) ,
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Sleep Assessment Trial in a High Air-Quality Nap-Box based ..:
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2023 32nd IEEE International Conference on Robot and Human Interactive Communication (RO-MAN) ,
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ISS/JEM crew-task analysis to support astronauts with intra..:
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2023 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS) ,
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Vacuum Ultraviolet Search from Thorium-229 Isomer in Crysta..:
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49th European Conference on Optical Communications (ECOC 2023) ,
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384Gb/s PAM transmission with CMOS-class driving voltage, o..:
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2023 20th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON) ,
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On the lactone content distribution estimation in Andrograp..:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
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Application of a performance evaluation standard for a GAGG..:
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2023 21st International Workshop on Junction Technology (IWJT) ,
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A Novel Method to Improve CMP Selectivity by Ultra-High-Dos..:
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2023 International Electron Devices Meeting (IEDM) ,
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High Peformance 3D Flash Memory with 3.2Gbps Interface and ..:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
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Iodine-131 whole gamma imaging outperforms clinical SPECT:
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2022 Compound Semiconductor Week (CSW) ,
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Vacuum UV Emission Property of Zn-doped MgO films Grown by ..:
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Lecture Notes in Computer Science; Formal Modeling and Analysis of Timed Systems ,
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Neural Network Repair with Reachability Analysis:
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2022 International Electron Devices Meeting (IEDM) ,
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