Chung, Wen-Yuan
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Highly Scaled BEOL-Compatible Thin Film Transistors With Ul..:

Liang, Yan-Kui ; Zheng, Jun-Yang ; Lin, Yu-Lon...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3671-3677 , 2024
 
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Critical Defect Detection at 3nm Technology Node: Enhanced ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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