Hikavyy, A.
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2

Compressively strained epitaxial Ge layers for quantum comp..:

Shimura, Yosuke ; Godfrin, Clement ; Hikavyy, Andriy...
Materials Science in Semiconductor Processing.  174 (2024)  - p. 108231 , 2024
 
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Compressively strained epitaxial Ge layers for quantum comp..:

Shimura, Yosuke ; Godfrin, Clement ; Hikavyy, Andriy...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mssp.2024.108231.  , 2024
 
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Nanosheet-based Complementary Field-Effect Transistors (CFE..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Mertens, H. ; Hosseini, M. ; Chiarella, T.... - p. 1-2 , 2023
 
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Comprehensive 300 mm process for Silicon spin qubits with m..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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Low temperature selective growth of Ga-doped and Ga–B co-do..:

Porret, Clement ; Rengo, Gianluca ; Ayyad, Mustafa...
Japanese Journal of Applied Physics.  62 (2023)  SC - p. SC1043 , 2023
 
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Nanosheet-based Device Architectures with Front/Backside Co..:

, In: 2023 21st International Workshop on Junction Technology (IWJT),
Veloso, A. ; Eneman, G. ; Matagne, P.... - p. 1-5 , 2023
 
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Forksheet FETs with Bottom Dielectric Isolation, Self-Align..:

, In: 2022 International Electron Devices Meeting (IEDM),
Mertens, H. ; Ritzenthaler, R. ; Oniki, Y.... - p. 23.1.1-23.1.4 , 2022
 
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B and Ga Co-Doped Si1−xGex for p-Type Source/Drain Contacts:

Rengo, Gianluca ; Porret, Clement ; Hikavyy, Andriy...
ECS Journal of Solid State Science and Technology.  11 (2022)  2 - p. 024008 , 2022
 
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Scaled FinFETs Connected by Using Both Wafer Sides for Rout..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Veloso, A. ; Jourdain, A. ; Radisic, D.... - p. 284-285 , 2022
 
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Demonstration of 3D sequential FD-SOI on CMOS FinFET stacki..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Vandooren, A. ; Parihar, N. ; Franco, J.... - p. 330-331 , 2022
 
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Low temperature source/drain epitaxy and functional silicid..:

, In: 2022 International Electron Devices Meeting (IEDM),
Porret, C. ; Everaert, J.-L. ; Schaekers, M.... - p. 34.1.1-34.1.4 , 2022
 
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Innovations in Transistor Architecture and Device Connectiv..:

, In: 2022 International Conference on IC Design and Technology (ICICDT),
Veloso, A. ; Eneman, G. ; De Keersgieter, A.... - p. 51-54 , 2022
 
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