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2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
8
An Evaluation of a Testability Measure for State Assignment..:
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2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
9
A Block Partitioning Method for Region Exhaustive Test to R..:
, In:
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2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
11
An Estimation Method of Defect Types Using Artificial Neura..:
, In:
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2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
14