Hosokawa, Toshinori
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3

CRLock: A SAT and FALL Attacks Resistant Logic Locking Meth..:

YOSHIMURA, Masayoshi ; TSUJIKAWA, Atsuya ; HOSOKAWA, Toshinori
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.  E107.A (2024)  3 - p. 583-591 , 2024
 
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6

Nationwide Descriptive Epidemiological Study of Patients wi..:

Nomoto, Hidetoshi ; Ishikane, Masahiro ; Gu, Yoshiaki...
Japanese Journal of Infectious Diseases.  76 (2023)  1 - p. 20-26 , 2023
 
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8

An Evaluation of a Testability Measure for State Assignment..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
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9

A Block Partitioning Method for Region Exhaustive Test to R..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
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11

An Estimation Method of Defect Types Using Artificial Neura..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
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14

An Evaluation of Estimated Field Random Testability for Dat..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
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