Kim, Duk Gon
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2

Drain Current Degradation Induced by Charge Trapping/De-Tra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kim, Taeyoung ; Lim, Suhwan ; Myeong, Ilho... - p. P6.EM-1-P6.EM-4 , 2024
 
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9

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024
 
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10

Laminated Ferroelectric FET With Large Memory Window and Hi..:

Lee, Hyun Jae ; Nam, Seunggeol ; Lee, Yunseong...
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2411-2416 , 2024
 
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11

Acute and chronic effects of triclosan on the behavior, phy..:

Do, Seong Duk ; Haque, Md. Niamul ; Kim, Jaehee..
Comparative Biochemistry and Physiology Part C: Toxicology & Pharmacology.  276 (2024)  - p. 109810 , 2024
 
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12

Semi-Quantitative Analysis of Lung Perfusion SPECT/CT for E..:

Han, Shin Ae ; Han, Sangwon ; Lee, Jinho...
Nuclear Medicine and Molecular Imaging.  58 (2024)  5 - p. 291-299 , 2024
 
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