Knoll, Joachim H
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1

Outlook to the Future of Reliability:

, In: Recent Advances in Microelectronics Reliability,
van Driel, W. D. ; Pressel, K. ; Soyturk, M... - p. 385-399 , 2024
 
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5

Stratigraphy and taphonomy of tubular macrofossils in Terre..:

Etemad-Saeed, Najmeh ; Anderson, Ross P. ; Tosca, Nicholas J...
Palaeogeography, Palaeoclimatology, Palaeoecology.  639 (2024)  - p. 112084 , 2024
 
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7

Digital Twin Technology in Electronics:

, In: Recent Advances in Microelectronics Reliability,
Moeller, H. ; Inamdar, A. ; van Driel, W. D.... - p. 283-321 , 2024
 
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13

Richard J. Evans: Das Dritte Reich und seine Verschwörungst..:

Knoll, Joachim H.
Zeitschrift für Religions- und Geistesgeschichte.  75 (2023)  2 - p. 204-206 , 2023
 
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