E-LIB Suche - Ergebnisse für: Nanver, Lis K.

1

Broadband PureB Ge-on-Si Photodiodes:

Nanver, Lis K. ; Hassan, Vinayak V. ; Attariabad, Asma..
IEEE Electron Device Letters. 45 (2024) 6 - p. 1040-1043 , 2024

Link: https://doi.org/10.1109/..

2

Identifying nano-Schottky diode currents in silicon diodes ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),

Knezevic, Tihomir ; Nanver, Lis K - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

3

Physica status solidi

Volume 61, Number 1: September 16 Physica status solidi ; Volume 61, Number 1, A

Ainger, F. W ; Aleksandrova, I. P ; Almeida, A... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

4

Checks on temperature during on-wafer I-V characterization ..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),

van Zoeren, J. ; Nanver, L.K. - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

5

PureB diode fabrication using physical or chemical vapor de..:

Thammaiah, Shivakumar D. ; Liu, Xingyu ; Knežević, Tihomir...
Solid-State Electronics. 177 (2021) - p. 107938 , 2021

Link: https://doi.org/10.1016/..

6

Low-Temperature Electrical Performance of PureB Photodiodes..:

Knezevic, Tihomir ; Suligoj, Tomislav ; Capan, Ivana.
IEEE Transactions on Electron Devices. 68 (2021) 6 - p. 2810-2817 , 2021

Link: https://doi.org/10.1109/..

7

Nanometer-thin pure boron CVD layers as material barrier to..:

Shivakumar, D. Thammaiah ; Knežević, Tihomir ; Nanver, Lis K.
Journal of Materials Science: Materials in Electronics. 32 (2021) 6 - p. 7123-7135 , 2021

Link: https://doi.org/10.1007/..

8

Optoelectrical Operation Stability of Broadband PureGaB Ge-..:

Krakers, Max ; Knežević, Tihomir ; Nanver, Lis K.
Journal of Electronic Materials. 50 (2021) 12 - p. 7026-7036 , 2021

Link: https://doi.org/10.1007/..

9

Nanolayer boron-semiconductor interfaces and their device a..:

Nanver, Lis K. ; Qi, Lin ; Liu, Xingyu.
Solid-State Electronics. 186 (2021) - p. 108041 , 2021

Link: https://doi.org/10.1016/..

10

Nanometer-thin pure boron CVD layers as material barrier to..:

Shivakumar, D. Thammaiah ; Knežević, Tihomir ; Nanver, Lis K
https://vbn.aau.dk/da/publications/5bb5df83-9cb6-4c18-8f76-486f90b52de2. , 2021

Link: https://vbn.aau.dk/da/pu..

11

Optoelectrical Operation Stability of Broadband PureGaB Ge-..:

Krakers, Max ; Knežević, Tihomir ; Nanver, Lis K
https://vbn.aau.dk/da/publications/680e85e0-974a-4917-8a18-4dbe2eeba39e. , 2021

Link: https://vbn.aau.dk/da/pu..

12

Investigation of Pd/MoOx/n-Si diodes for bipolar transistor..:

Gupta, Gaurav ; D. Thammaiah, Shivakumar ; Nanver, Lis K..
Journal of Applied Physics. 128 (2020) 5 - p. , 2020

Link: https://doi.org/10.1063/..

13

Diode design for studying material defect distributions wit..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),

Krakers, M. ; Knezevic, T. ; Batenburg, K.M... - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

14

Impact of ultra-thin-layer material parameters on the suppr..:

, In: 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO),

Knezevic, Tihomir ; Suligoj, Tomislav ; Nanver, Lis K. - p. 24-29 , 2019

Link: https://doi.org/10.23919..

15

Reverse breakdown and light-emission patterns studied in Si..:

, In: 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO),

Krakers, Max ; Kneevic, T. ; Nanver, L. K. - p. 30-35 , 2019

Link: https://doi.org/10.23919..