Natzke, P
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1

Exploring the border traps near the SiO2-SiC interface usin..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kumar, P. ; Krummenacher, M. ; Medeiros, H. G.... - p. 1-6 , 2024
 
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5

First Evidence of Axial Shape Asymmetry and Configuration C..:

Rocchini, M ; Garrett, P. E ; Zielińska, M...
info:eu-repo/semantics/altIdentifier/wos/WOS:000960591800006.  , 2023
 
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11

On the role of Sc in powders and spray deposits of hypoeute..:

Henein, H. ; Bogno, A-A. ; Yin, S...
Canadian Metallurgical Quarterly.  62 (2022)  2 - p. 232-243 , 2022
 
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12

Heavy-ion induced single event effects and latent damages i..:

Martinella, C. ; Natzke, P. ; Alia, R.G....
Microelectronics Reliability.  128 (2022)  - p. 114423 , 2022
 
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15

On the role of Sc in powders and spray deposits of hypoeute..:

Henein, H ; Bogno, A.-A ; Yin, S..
https://era.library.ualberta.ca/items/1753265e-6515-4304-915a-7b512fa52ef8.  , 2022
 
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