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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
1
Lattice Scattering Related Flicker Noise in Silicon-Doped H..:
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2024 IEEE International Memory Workshop (IMW) ,
2
Enhanced reliability and trapping behavior in ferroelectric..:
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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
4
Efficient Characterization Methodology for Low-Frequency No..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
5
Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectr..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
7
Spike-Time Dependent Plasticity in HfO₂-Based Ferroelectric..:
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2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
9
Demonstration of Large Polarization in Si-doped HfO2 Metal–..:
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2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
10
28nm HKMG 1F-1R2 Multilevel Memory for Inference Engine App..:
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2023 IEEE International Integrated Reliability Workshop (IIRW) ,
11
Low-Frequency Noise Sources and Back-Gate Coupling Effects ..:
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2023 IEEE International Memory Workshop (IMW) ,
12
Hafnium oxide-based Ferroelectric Memories: Are we ready fo..:
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2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
13
Demonstration of Differential Mode FeFET-Array for multi-pr..:
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2023 IEEE International Integrated Reliability Workshop (IIRW) ,
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