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Rassoul, Nouredine
20  results:
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1

Fundamental understanding of NBTI degradation mechanism in ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Zhao, Ying ; Rinaudo, Pietro ; Chasin, Adrian... - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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2

Light-Assisted Investigation of the Role of Oxygen Flow dur..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Rinaudo, Pietro ; Chasin, Adrian ; Zhao, Ying... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Novel Cross-Point Architecture utilizing Distributed Diode ..:

, In: 2024 IEEE International Memory Workshop (IMW),
Ravsher, Taras ; Fantini, Andrea ; Trivedi, Kruti... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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4

Study of Contact Resistance Components in Short-Channel Ind..:

Tang, Hongwei ; Dekkers, Harold ; Rassoul, Nouredine...
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 567-573 , 2024
Link: https://doi.org/10.1109/..
 
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5

Demonstration of multilevel multiply accumulate operations ..:

, In: 2023 IEEE International Memory Workshop (IMW),
Subhechha, Subhali ; Cosemans, Stefan ; Belmonte, Attilio... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

Device modeling of two-steps oxygen anneal-based submicron ..:

Kim, Donguk ; Kim, Je-Hyuk ; Choi, Woo Sik...
Scientific Reports.  12 (2022)  1 - p. , 2022
Link: https://doi.org/10.1038/..
 
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7

Deposition, Characterization, and Performance of Spinel InG..:

Dekkers, Hendrik F. W. ; van Setten, Michiel J. ; Belmonte, Attilio...
ACS Applied Electronic Materials.  4 (2022)  3 - p. 1238-1249 , 2022
Link: https://doi.org/10.1021/..
 
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8

The Low-Frequency Noise Behavior of Advanced Logic and Memo..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
Simoen, Eddy ; Ritzenthaler, Romain ; Mertens, Hans... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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9

Device modeling of two-steps oxygen anneal-based submicron ..:

Donguk Kim ; Je-Hyuk Kim ; Woo Sik Choi...
https://doi.org/10.1038/s41598-022-23951-x.  , 2022
Link: https://doi.org/10.1038/..
 
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10

Device modeling of two-steps oxygen anneal-based submicron ..:

Kim, Donguk ; Kim, Je-Hyuk ; Choi, Woo Sik...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9653482/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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11

Oxygen Defect Stability in Amorphous, C-Axis Aligned, and S..:

van Setten, Michiel J. ; Dekkers, Harold F. W. ; Kljucar, Luka...
ACS Applied Electronic Materials.  3 (2021)  9 - p. 4037-4046 , 2021
Link: https://doi.org/10.1021/..
 
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12

11‐2: Technology Developments in High‐Resolution FMM‐free O..:

Ke, Tung-Huei ; Glushkova, Anastasia ; Sandeheng, Calvin Mona...
SID Symposium Digest of Technical Papers.  52 (2021)  1 - p. 127-130 , 2021
Link: https://doi.org/10.1002/..
 
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13

Oxygen Defect Stability in Amorphous, C ‑Axis Aligned, and ..:

Michiel J. van Setten (11371705) ; Harold F. W. Dekkers (10197708) ; Luka Kljucar (11371708)...
https://figshare.com/articles/dataset/Oxygen_Defect_Stability_in_Amorphous_i_C_i_Axis_Aligned_and_Spinel_IGZO/16553908.  , 2021
Link: https://doi.org/10.1021/..
 
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14

Oxygen Defect Stability in Amorphous, C ‑Axis Aligned, and ..:

Michiel J. van Setten (11371705) ; Harold F. W. Dekkers (10197708) ; Luka Kljucar (11371708)...
https://figshare.com/articles/dataset/Oxygen_Defect_Stability_in_Amorphous_i_C_i_Axis_Aligned_and_Spinel_IGZO/16553911.  , 2021
Link: https://doi.org/10.1021/..
 
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15

(Invited) Sub-40mV Sigma VTH Igzo nFETs in 300mm Fab:

Mitard, Jerome ; Kljucar, Luka ; Rassoul, Nouredine...
ECS Transactions.  98 (2020)  7 - p. 205-217 , 2020
Link: https://doi.org/10.1149/..
 
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