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Vexler, Robert I.
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1

Variability and high temperature reliability of graphene fi..:

Illarionov, Yu. Yu. ; Knobloch, T. ; Uzlu, B....
npj 2D Materials and Applications.  8 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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2

Contributors:

, In: Modern Inference Based on Health-Related Markers,
Albert, Paul S. ; Allotey, Prince A. ; Appleton, Allison A.... - p. ix-xi , 2024
Link: https://doi.org/10.1016/..
 
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3

On The Contribution of Secondary Holes in Hot-Carrier Degra..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Tyaginov, S.E. ; Bury, E. ; Grill, A.... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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4

Effect of fluoride layer thickness on the leakage current i..:

Banshchikov, A.G. ; Dvortsova, P.A. ; Illarionov, Yu.Yu....
Thin Solid Films.  783 (2023)  - p. 140058 , 2023
Link: https://doi.org/10.1016/..
 
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5

Calcium Fluoride Films with 2–10 nm Thickness on Silicon-(1..:

Banshchikov, A. G. ; Vexler, M. I. ; Ivanov, I. A....
Semiconductors.  57 (2023)  4 - p. 211-215 , 2023
Link: https://doi.org/10.1134/..
 
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6

STEM course on circuit design accomplished to enhance scien..:

Vexler, V ; Aibashev, M ; Saipbekova, A..
Journal of Physics: Conference Series.  2193 (2022)  1 - p. 012082 , 2022
Link: https://doi.org/10.1088/..
 
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7

Structure, electronic properties, and energetics of oxygen ..:

El-Sayed, Al-Moatasem ; Jech, Markus ; Waldhör, Dominic...
Physical Review Materials.  6 (2022)  12 - p. , 2022
Link: https://doi.org/10.1103/..
 
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8

The performance limits of hexagonal boron nitride as an ins..:

Knobloch, Theresia ; Illarionov, Yury Yu. ; Ducry, Fabian...
Nature Electronics.  4 (2021)  2 - p. 98-108 , 2021
Link: https://doi.org/10.1038/..
 
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9

Educational resource of studying Robotics in STEM learning ..:

Vexler, V ; Bazhenov, R ; Fominykh, I..
Journal of Physics: Conference Series.  1691 (2020)  1 - p. 012041 , 2020
Link: https://doi.org/10.1088/..
 
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10

Reliability of scalable MoS2 FETs with 2 nm crystalline CaF..:

Illarionov, Yury Yu ; Banshchikov, Alexander G ; Polyushkin, Dmitry K...
2D Materials.  6 (2019)  4 - p. 045004 , 2019
Link: https://doi.org/10.1088/..
 
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11

Trends in Reverse-Current Change in Tunnel MIS Diodes with ..:

Banshchikov, A. G. ; Illarionov, Yu. Yu. ; Vexler, M. I...
Semiconductors.  53 (2019)  6 - p. 833-837 , 2019
Link: https://doi.org/10.1134/..
 
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12

Impact of the Device Geometric Parameters on Hot-Carrier De..:

Tyaginov, S. E. ; Makarov, A. A. ; Kaczer, B....
Semiconductors.  52 (2018)  13 - p. 1738-1742 , 2018
Link: https://doi.org/10.1134/..
 
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13

Simulating Tunneling Electron Transport in the Semiconducto..:

Vexler, M. I.
Semiconductors.  52 (2018)  8 - p. 1031-1036 , 2018
Link: https://doi.org/10.1134/..
 
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14

Physical Principles of Self-Consistent Simulation of the Ge..:

Tyaginov, S. E. ; Makarov, A. A. ; Jech, M....
Semiconductors.  52 (2018)  2 - p. 242-247 , 2018
Link: https://doi.org/10.1134/..
 
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15

Analysis of the Features of Hot-Carrier Degradation in FinF..:

Makarov, A. A. ; Tyaginov, S. E. ; Kaczer, B....
Semiconductors.  52 (2018)  10 - p. 1298-1302 , 2018
Link: https://doi.org/10.1134/..
 
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