E-LIB Suche - Ergebnisse für: Arruti, Asier

1

The Composite Improved Generalized Steinmetz Equation (ciGS..:

Arruti, Asier ; Anzola, Jon ; Pérez-Cebolla, Francisco José..
IEEE Transactions on Power Electronics. 39 (2024) 1 - p. 1162-1173 , 2024

Link: https://doi.org/10.1109/..

2

Estimation of Semiconductor Power Losses Through Automatic ..:

Sanz-Alcaine, José Miguel ; Sebastián, Eduardo ; Perez-Cebolla, Francisco José...
IEEE Transactions on Power Electronics. , 2024

Link: https://doi.org/10.1109/..

3

Modeling and Analysis of Partial Power Concept for Data Cen..:

, In: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC),

Wu, Di ; Wang, Pinhe ; Lyu, Yanda... - p. 2644-2650 , 2024

Link: https://doi.org/10.1109/..

4

Integrated Magnetic Design for High Power Density Converter:

, In: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC),

Wang, Pinhe ; Arruti, Asier ; Huang, Jiasheng... - p. 3235-3241 , 2024

Link: https://doi.org/10.1109/..

5

A New Hybrid Control for Zero Voltage Switching Based on Hi..:

, In: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC),

Wu, Di ; Lyu, Yanda ; Wang, Pinhe... - p. 2705-2711 , 2024

Link: https://doi.org/10.1109/..

6

On the Impact of DC Magnetization on Core Losses: A Model B..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),

Arruti, Asier ; Aizpuru, Iosu ; Mazuela, Mikel - p. 1-8 , 2023

Link: https://doi.org/10.23919..

7

Loss Measurement of Low RDS Devices Through Thermal Modelli..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),

Sanz-Alcaine, Jose Miguel ; Jose Perez-Cebolla, Francisco ; Bernal-Ruiz, Carlos... - p. 1-7 , 2023

Link: https://doi.org/10.23919..

8

A High Frequency Magnetic Test Bench with Fast Isothermal M..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),

Agote, Anartz ; Arruti, Asier ; Aizpuru, Iosu - p. 1-9 , 2023

Link: https://doi.org/10.23919..

9

Experimental verification of the AC resistance effect in In..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),

Aizpuru, Iosu ; Lajas, Miguel ; Arruti, Asier... - p. 1-8 , 2023

Link: https://doi.org/10.23919..

10

Loss Measurement of Low RDS Devices Through Thermal Modelli..:

Sanz-Alcaine, Jose Miguel ; Perez-Cebolla, Francisco Jose ; Bernal-Ruiz, Carlos...
http://arxiv.org/abs/2308.12685. , 2023

Link: http://arxiv.org/abs/230..

11

Estimation of Semiconductor Power Losses Through Automatic ..:

Sanz-Alcaine, Jose Miguel ; Sebastian, Eduardo ; Perez-Cebolla, Francisco Jose...
http://arxiv.org/abs/2310.19049. , 2023

Link: http://arxiv.org/abs/231..

12

Demystifying Non-Isolated DC–DC Topologies on Partial Power..:

Anzola, Jon ; Aizpuru, Iosu ; Arruti, Asier..
Electronics. 11 (2022) 3 - p. 480 , 2022

Link: https://doi.org/10.3390/..

13

Single Core and Modular Transformer Solutions: a Trade-Off ..:

, In: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society,

Arruti, Asier ; Anzola, Jon ; Aizpuru, Iosu. - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

14

Demystifying Non-Isolated DC–DC Topologies on Partial Power..:

Jon Anzola ; Iosu Aizpuru ; Asier Arruti..
Power Electronics. , 2022

Link: https://doi.org/10.3390/..

15

Demystifying Non-Isolated DC–DC Topologies on Partial Power..:

Jon Anzola ; Iosu Aizpuru ; Asier Arruti..
https://www.mdpi.com/2079-9292/11/3/480. , 2022

Link: https://doi.org/10.3390/..