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Machine Learning in VLSI Computer-Aided Design ,
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Large-Scale Circuit Performance Modeling by Bayesian Model ..:
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Proceedings of the 25th ACM SIGKDD International Conference on Knowledge Discovery & Data Mining ,
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A Generalized Framework for Population Based Training:
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Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition ,
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Fast eye diagram analysis for high-speed CMOS circuits:
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Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition ,
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Efficient bit error rate estimation for high-speed link by ..:
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2015 IEEE Custom Integrated Circuits Conference (CICC) ,
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Session 23 — Modeling emerging devices:
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Proceedings of the 52nd Annual Design Automation Conference ,
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mTunes : efficient post-silicon tuning of mixed-signal/R..:
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Proceedings of the 51st Annual Design Automation Conference ,
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Probabilistic Bug Localization via Statistical Inference ba..:
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Proceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design ,
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MPME-DP : multi-population moment estimation via dirichl..:
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Proceedings of the 50th Annual Design Automation Conference ,
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Bayesian model fusion : large-scale performance modeling..:
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Proceedings of the 50th Annual Design Automation Conference ,
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Efficient moment estimation with extremely small sample siz..:
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Proceedings of the International Conference on Computer-Aided Design ,
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Bayesian model fusion : a statistical framework for effi..:
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Proceedings of the International Conference on Computer-Aided Design ,
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Challenges in post-silicon validation of high-speed I/O lin..:
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Proceedings of the International Conference on Computer-Aided Design ,
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Efficient parametric yield estimation of analog/mixed-signa..:
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Proceedings of the International Conference on Computer-Aided Design ,
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Session details: Timing and behavioral modeling:
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Proceedings of the 49th Annual Design Automation Conference ,
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