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Dong, Yongshun
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1

Achieving Last-Mile Functional Coverage in Testing Chip Des..:

, In: 2023 IEEE/ACM 45th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP),
Yan, Ming ; Chen, Junjie ; Mao, Hangyu... - p. 343-354 , 2023
Link: https://doi.org/10.1109/..
 
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Mask- and Contrast-Enhanced Spatio-Temporal Learning for Ur..:

, In: Proceedings of the 32nd ACM International Conference on Information and Knowledge Management,
Zhang, Xu ; Gong, Yongshun ; Zhang, Xinxin... - p. 3298-3307 , 2023
Link: https://dl.acm.org/doi/1..
 
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Inferring the Importance of Product Appearance with Semi-su..:

, In: Proceedings of the 29th ACM International Conference on Multimedia,
Gong, Yongshun ; Yi, Jinfeng ; Chen, Dong-Dong... - p. 1120-1128 , 2021
Link: https://dl.acm.org/doi/1..
 
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