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Ning, Bingxu
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Characterization of Reliabilities of 22 nm UTBB FDSOI Ring ..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Cai, Chang ; Zhao, Kai ; Yu, Jian... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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Large-tilt Heavy Ions Induced SEU in Multiple Radiation Har..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Cai, Chang ; Liu, Tianqi ; Liu, Jie... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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