Raghavan, Nagarajan
28  results:
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1

Parameter Identification and Optimization for Lithium-Ion B..:

, In: 2024 IEEE International Conference on Prognostics and Health Management (ICPHM),
Sahay, Rahul ; Raghavan, Nagarajan - p. 356-366 , 2024
 
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2

Remaining Useful Life Estimation for Lithium-Ion Batteries ..:

, In: 2024 IEEE International Conference on Prognostics and Health Management (ICPHM),
 
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3

Fault Detection and Isolation of Cyber-Physical System unde..:

, In: 2024 IEEE International Conference on Prognostics and Health Management (ICPHM),
 
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4

Thermal simulations of lock-in-thermography for failure ana..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Qiu, Wen ; Zee, Bernice ; Pey, Kin Leong. - p. 1-6 , 2023
 
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5

A New Methodology to Precisely Induce Wake-Up for Reliabili..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Tan, Tiang Teck ; Wang, Yu-Yun ; Tan, Joel... - p. 1-7 , 2023
 
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6

Electrical Stress Induced Breakdown and Post Breakdown Phys..:

, In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC),
Maruvada, Anirudh ; O'Shea, Sean J. ; Deng, Jie... - p. 452-456 , 2023
 
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7

Reliability Analysis of Random Telegraph Noisebased True Ra..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
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8

Remaining Useful Life Estimation of Lithium-Ion Batteries V..:

, In: 2023 Global Reliability and Prognostics and Health Management Conference (PHM-Hangzhou),
 
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9

Effect of Surface Functionalization of Single-Walled Carbon..:

, In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC),
 
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10

Multi-Physics Simulation-Based Prognosis of Titanium Dioxid..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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12

Deep Learning Based Detection for Mitigating Sneak Path Int..:

, In: 2020 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia),
Zhong, Xingwei ; Cai, Kui ; Song, Guanghui. - p. 1-4 , 2020
 
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13

Generalized Convolution Simulation Stack for RRAM Device ba..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
 
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14

Exploration of Multi-output Gaussian Process Regression for..:

, In: 2020 Prognostics and Health Management Conference (PHM-Besançon),
 
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15

AI-Assisted Package Design for Improved Warpage Control of ..:

, In: 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
 
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