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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
4
Automatic prediction of MOSFETs threshold voltage by machin..:
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2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) ,
8
Combined Machine Learning Techniques For Characteristics Cl..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
10
Scaling of double-gated WS2 FETs to sub-5nm physical gate l..:
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2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
14