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2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE) ,
3
Electrical characterization and modeling of FDSOI MOSFETs f..:
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2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ,
6
Integrated Variability Measurements of 28 nm FDSOI MOSFETs ..:
, In:
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2019 34th Symposium on Microelectronics Technology and Devices (SBMicro) ,
9