Search for persons
X
?
2022 China Semiconductor Technology International Conference (CSTIC) ,
2
The Low-Frequency Noise Behavior of Advanced Logic and Memo..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
6
Relevance of fin dimensions and high-pressure anneals on ho..:
, In:
?
2019 19th International Workshop on Junction Technology (IWJT) ,
7
Junction technology challenges and solutions for 3D device ..:
, In:
?
2019 IEEE 13th International Conference on ASIC (ASICON) ,
8
Impact of Device Architecture and Gate Stack Processing on ..:
, In:
?
2019 IEEE International Integrated Reliability Workshop (IIRW) ,
9
Reliability in Stacked Gate-All-Around Si Nanowire Devices:..:
, In:
?
2016 IEEE International Reliability Physics Symposium (IRPS) ,
14