Stockinger, Michael
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6

Hidden Threats during automated Latch-up Testing:

, In: 2022 44th Annual EOS/ESD Symposium (EOS/ESD),
 
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8

Low-Leakage NMOS Clamps with Gate-Assisted Bipolar Triggeri..:

, In: 2019 41st Annual EOS/ESD Symposium (EOS/ESD),
Stockinger, Michael - p. 1-10 , 2019
 
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10

2013 Outstanding Paper and Best Paper Award:

, In: 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD),
 
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