Wenpo, Zhang
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3

Improving Small-Delay Fault Coverage of On-Chip Delay Measu..:

ZHANG, Wenpo ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E97.D (2014)  10 - p. 2719-2729 , 2014
 
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4

Scan Shift Time Reduction Using Test Compaction for On-Chip..:

ZHANG, Wenpo ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E97.D (2014)  3 - p. 533-540 , 2014
 
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5

Improving Test Coverage by Measuring Path Delay Time Includ..:

ZHANG, Wenpo ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E96.D (2013)  5 - p. 1219-1222 , 2013
 
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11

Interface sites on vanadia-based catalysts are highly activ..:

Lv, Zhihui ; He, Guangzhi ; Zhang, Wenshuo...
Journal of Environmental Sciences.  136 (2024)  - p. 523-536 , 2024
 
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12

Phosphorus poisoning and regeneration of the Cu-LTA catalys..:

Hu, Xueyang ; Lin, Jinhan ; Tan, Xuechao...
Catalysis Science & Technology.  14 (2024)  5 - p. 1293-1304 , 2024
 
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