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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
4
Effects of Source/Drain Electrodes on Thermal Stability of ..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
6
The Impact of Thermal Noise in Multi-Domain Hf-based Antife..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
10
First Study of the Charge Trapping Aggravation Induced by A..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
11
Non-Destructive-Read 1T1C Ferroelectric Capacitive Memory C..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
12
First Demonstration of BEOL-Compatible MFMIS Fe-FETs with 3..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
15