Personensuche
X
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1
System-on-chip test architectures
nanometer design for testability
The Morgan Kaufmann series in systems on silicon
Exemplar:
Zentrale:E02 a inf 170 ef/741
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2
Theory and design of CNC systems
Springer series in advanced manufacturing
Exemplare:
Zentrale:E02 a ing 401 e/525; TB BHV: fer 628/11
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5
, In:
The history of English law before the time of Edward I. / F..:
,Exemplar:
Zentrale:Magazin 03.h.5895
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6
, In:
The history of English law before the time of Edward I. / F..:
,Exemplar:
Zentrale:Magazin 03.h.5894
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7
Stephen Vincent Benét
Twayne's United States authors series ; 27
Exemplar:
Zentrale:Magazin 02.F.4650