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Markov, P. O.
22  Ergebnisse:
Buchkapitel (Online) X
englisch X
Personensuche X
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1

Contributor contact details:

, In: Silicon-On-Insulator (SOI) Technology,
Kononchuk, O. ; Nguyen, B.-Y. ; Moriceau, H.... - p. xi-xiii , 2014
Link: https://doi.org/10.1016/..
 
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2

The Theory of Anharmonic Bloch Oscillations in the Coupler ..:

, In: 2018 IEEE 8th International Conference Nanomaterials: Application & Properties (NAP),
Korovai, O.V. ; Markov, D.A. ; Khadzhi, P.I. - p. 1-4 , 2018
Link: https://doi.org/10.1109/..
 
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3

SINS/GNSS Aided by Autonomous AHRS for a Small UAV:

, In: 2020 European Navigation Conference (ENC),
Kulakova, V. I. ; Markov, A. O. ; Sokharev, A. Yu. - p. 1-10 , 2020
Link: https://doi.org/10.23919..
 
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4

Excitation of Broadband Signals in Coaxial TWT:

, In: 2007 International Kharkov Symposium Physics and Engrg. of Millimeter and Sub-Millimeter Waves (MSMW),
Galaydych, K.V. ; Markov, P.I. ; Sotnikov, G.V. - p. None , 2007
Link: https://doi.org/10.1109/..
 
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5

Effect evaluation of the boom length and the bucket capacit..:

, In: Advances in Raw Material Industries for Sustainable Development Goals,
Khoreshok, A.A. ; Tyulenev, M.A. ; Markov, S.O... - p. 413-421 , 2020
Link: https://doi.org/10.1201/..
 
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6

Study of structural features of draglines for their possibl..:

, In: Advances in Raw Material Industries for Sustainable Development Goals,
Khoreshok, A.A. ; Tyulenev, M.A. ; Markov, S.O. - p. 406-412 , 2020
Link: https://doi.org/10.1201/..
 
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7

Performance and Reliability of 4 Mb eFLASH Memory Array Fea..:

, In: 2020 IEEE International Memory Workshop (IMW),
Jourba, S. ; Bollon, N. ; Decobert, C.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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8

40nm Embedded Self-Aligned Split-Gate Flash Technology for ..:

, In: 2017 IEEE International Memory Workshop (IMW),
Shum, Danny ; Luo, Lai Q. ; Kong, Y.J.... - p. 1-4 , 2017
Link: https://doi.org/10.1109/..
 
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9

Interplay between statistical reliability and variability: ..:

, In: 2013 IEEE International Reliability Physics Symposium (IRPS),
Gerrer, L. ; Millar, C. ; Asenov, A.... - p. 3A.2.1-3A.2.5 , 2013
Link: https://doi.org/10.1109/..
 
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10

Improving testability and soft-error resilience through ret..:

, In: Proceedings of the 46th Annual Design Automation Conference,
Krishnaswamy, Smita ; Markov, Igor L. ; Hayes, John P. - p. 508-513 , 2009
Link: https://dl.acm.org/doi/1..
 
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11

On the role of timing masking in reliable logic circuit des..:

, In: Proceedings of the 45th annual Design Automation Conference,
Krishnaswamy, Smita ; Markov, Igor L. ; Hayes, John P. - p. 924-929 , 2008
Link: https://dl.acm.org/doi/1..
 
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12

Checking equivalence of quantum circuits and states:

, In: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design,
Viamontes, George F. ; Markov, Igor L. ; Hayes, John P. - p. 69-74 , 2007
Link: https://dl.acm.org/doi/1..
 
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13

Enhancing design robustness with reliability-aware resynthe..:

, In: Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design,
Krishnaswamy, Smita ; Plaza, Stephen M. ; Markov, Igor L.. - p. 149-154 , 2007
Link: https://dl.acm.org/doi/1..
 
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14

Accurate Reliability Evaluation and Enhancement via Probabi..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1,
Krishnaswamy, Smita ; Viamontes, George F. ; Markov, Igor L.. - p. 282-287 , 2005
Link: https://dl.acm.org/doi/1..
 
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15

High-Performance QuIDD-Based Simulation of Quantum Circuits:

, In: Proceedings of the conference on Design, automation and test in Europe - Volume 2,
Viamontes, George F. ; Markov, Igor L. ; Hayes, John P. - p. 21354 ff. , 2004
Link: https://dl.acm.org/doi/1..
 
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