Scharff, W.
117  Ergebnisse:
Personensuche X
?
3

Study of adhesion during actual contact area formation at l..:

Kovalev, A. V. ; Myshkin, N. K. ; Fominski, V. Yu...
Tribology - Materials, Surfaces & Interfaces.  2 (2008)  4 - p. 186-193 , 2008
 
?
6

Comparative measurements of annihilation rate coefficients ..:

Shogun, V. ; Tyablikov, A. ; Pashkov, V....
Surface and Coatings Technology.  116-119 (1999)  - p. 1123-1126 , 1999
 
?
7

An emission actinometric method for measuring of plasmachem..:

Shogun, V. ; Tyablikov, A. ; Abachev, M....
Surface and Coatings Technology.  98 (1998)  1-3 - p. 1406-1410 , 1998
 
?
8

Emission actinometric investigations of atomic hydrogen and..:

Shogun, V. ; Tyablikov, A. ; Schreiter, St....
Surface and Coatings Technology.  98 (1998)  1-3 - p. 1382-1386 , 1998
 
?
9

Application of an acousto-optic spectrometer for plasma etc..:

Shogun, V. ; Tyablikov, A. ; Shelyhmanov, E....
Surface and Coatings Technology.  74-75 (1995)  - p. 571-574 , 1995
 
?
11

Plasma-assisted CVD of diamond films by hollow cathode arc ..:

Stiegler, J. ; Roth, S. ; Hammer, K....
Diamond and Related Materials.  2 (1993)  2-4 - p. 413-416 , 1993
 
?
12

Noble gas ion assisted evaporation of carbon:

Ullmann, J. ; Falke, U. ; Scharff, W...
Thin Solid Films.  232 (1993)  2 - p. 154-160 , 1993
 
?
13

Determination of the optical constants of fine grained diam..:

Stenzel, O. ; Petrich, R. ; Roth, S...
Diamond and Related Materials.  2 (1993)  5-7 - p. 704-707 , 1993
 
1-15