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Beckmann, Karsten
126  Ergebnisse:
englisch X
Personensuche X
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1

Fcγ-Receptor-Independent Controlled Activation of CD40 Cano..:

Beckmann, Karsten ; Reitinger, Carmen ; Yan, Xianglei...
Antibodies.  13 (2024)  2 - p. 31 , 2024
Link: https://doi.org/10.3390/..
 
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2

Enhanced Computational Study with Experimental Correlation ..:

Sihn, Sangwook ; Chambers, William L. ; Abedin, Minhaz...
Small.  , 2024
Link: https://doi.org/10.1002/..
 
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3

Thermodynamic origin of nonvolatility in resistive memory:

Li, Jingxian ; Appachar, Anirudh ; Peczonczyk, Sabrina L....
Matter.  , 2024
Link: https://doi.org/10.1016/..
 
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4

Oxygen tracer diffusion in amorphous hafnia films for resis..:

Shin, Dongjae ; Ievlev, Anton V. ; Beckmann, Karsten...
Materials Horizons.  11 (2024)  10 - p. 2372-2381 , 2024
Link: https://doi.org/10.1039/..
 
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5

Material to system-level benchmarking of CMOS-integrated RR..:

Abedin, Minhaz ; Gong, Nanbo ; Beckmann, Karsten...
Scientific Reports.  13 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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6

Investigating Device Degradation and Revival in Resistive R..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Liehr, Maximilian ; Ravindra, Pramod ; Beckmann, Karsten. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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7

Effect of Resistance variability in Vector Matrix Multiplic..:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
Solanki, Jeelka ; Beckmann, Karsten ; Pelton, Jacob.. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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8

Analog NVM Synapse for Hardware-Aware Neural Network Traini..:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
Liehr, Maximilian ; Abedin, Minhaz ; Beckmann, Karsten. - p. 1-9 , 2023
Link: https://doi.org/10.1109/..
 
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9

Flow-Based Computing of NOR Logic Using ReRAM Devices:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
Woods, Zachery ; Cady, Nathaniel ; Liehr, Maximilian... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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10

Failure Analysis of 65nm CMOS Integrated Nanoscale ReRAM De..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Liehr, Maximilian ; Hazra, Jubin ; Beckmann, Karsten. - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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11

Electrical and structural properties of binary Ga–Sb phase ..:

Ume, Rubab ; Gong, Haibo ; Tokranov, Vadim...
Journal of Applied Physics.  132 (2022)  3 - p. , 2022
Link: https://doi.org/10.1063/..
 
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12

Detecting Temporal Correlation on HfO2 Based RRAM on 65nm C..:

, In: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS),
Rafiq, Sarah ; Abedin, Minhaz ; Beckmann, Karsten. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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13

Impact of Switching Variability, Memory Window, and Tempera..:

, In: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS),
Liehr, Maximilian ; Beckmann, Karsten ; Cady, Nathaniel - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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14

Ferroelectric Phase Content in 7 nm Hf(1−x)ZrxO2 Thin Films..:

Mukundan, Vineetha ; Consiglio, Steven ; Triyoso, Dina H....
physica status solidi (a).  218 (2021)  10 - p. , 2021
Link: https://doi.org/10.1002/..
 
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15

In-memory Computation of Error-Correcting Codes Using a Rec..:

, In: 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS),
Abedin, Minhaz ; Liehr, Maximilian ; Beckmann, Karsten... - p. 593-598 , 2021
Link: https://doi.org/10.1109/..
 
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