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X
Cho, Chulhee
198  Ergebnisse:
englisch X
Personensuche X
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1

An effective surface roughness extraction method using Part..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Lee, Youngjae ; Kim, Kwangho ; Cho, Chulhee... - p. 1777-1783 , 2024
Link: https://doi.org/10.1109/..
 
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2

A Novel Method for LPDDR5 DRAM Jitter Measurement Through D..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Lee, Manho ; Cho, Chulhee ; Lee, Hyeongi... - p. 1773-1776 , 2024
Link: https://doi.org/10.1109/..
 
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3

Characterization of SiO2 Plasma Etching with Perfluorocarbo..:

Choi, Minsu ; Lee, Youngseok ; You, Yebin...
Materials.  16 (2023)  16 - p. 5624 , 2023
Link: https://doi.org/10.3390/..
 
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4

Enhancement of Ar Ion Flux on the Substrate by Heterogeneou..:

Seong, Inho ; Kim, Sijun ; Choi, Minsu...
Materials.  16 (2023)  17 - p. 5746 , 2023
Link: https://doi.org/10.3390/..
 
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5

Determination of Plasma Potential Using an Emissive Probe w..:

Cho, Chulhee ; Kim, Sijun ; Lee, Youngseok...
Materials.  16 (2023)  7 - p. 2762 , 2023
Link: https://doi.org/10.3390/..
 
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6

Contribution of Ion Energy and Flux on High-Aspect Ratio Si..:

Jeong, Wonnyoung ; Kim, Sijun ; Lee, Youngseok...
Materials.  16 (2023)  10 - p. 3820 , 2023
Link: https://doi.org/10.3390/..
 
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7

Computational Analysis on Self-Resonance Frequency of Solen..:

Choi, Min-Su ; Kim, Si-Jun ; Lee, Young-Seok...
Applied Science and Convergence Technology.  32 (2023)  2 - p. 54-57 , 2023
Link: https://doi.org/10.5757/..
 
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8

Computational Study on the Parallel Double-Curling Probe fo..:

Kim, Si-Jun ; Jeong, Won-Nyoung ; Lee, Young-Seok...
Applied Science and Convergence Technology.  32 (2023)  5 - p. 127-133 , 2023
Link: https://doi.org/10.5757/..
 
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9

Development of the Tele-Measurement of Plasma Uniformity vi..:

Kim, Si-Jun ; Choi, Min-Su ; Lee, Sang-Ho...
Sensors.  23 (2023)  5 - p. 2521 , 2023
Link: https://doi.org/10.3390/..
 
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10

On the Quenching of Electron Temperature in Inductively Cou..:

Seong, Inho ; Kim, Si-jun ; Lee, Youngseok...
Materials.  16 (2023)  8 - p. 3219 , 2023
Link: https://doi.org/10.3390/..
 
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11

Low-Temperature Plasma Diagnostics to Investigate the Proce..:

Lee, Youngseok ; Kim, Sijun ; Lee, Jangjae...
Sensors.  22 (2022)  16 - p. 6029 , 2022
Link: https://doi.org/10.3390/..
 
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12

Characterization of an Etch Profile at a Wafer Edge in Capa..:

Seong, Inho ; Lee, Jinho ; Kim, Sijun...
Nanomaterials.  12 (2022)  22 - p. 3963 , 2022
Link: https://doi.org/10.3390/..
 
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13

Investigation into SiO2 Etching Characteristics Using Fluor..:

Jeong, Won-nyoung ; Lee, Young-seok ; Cho, Chul-hee..
Nanomaterials.  12 (2022)  24 - p. 4457 , 2022
Link: https://doi.org/10.3390/..
 
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14

Safety of Chamber Exterior Wall Ground:

You, Ye-Bin ; Kim, Si-Jun ; Lee, Young-Seok...
Applied Science and Convergence Technology.  31 (2022)  5 - p. 103-106 , 2022
Link: https://doi.org/10.5757/..
 
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15

Differential Via Optimization for PCIe Gen5 Channel based o..:

, In: 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS),
Cho, Chulhee ; Kim, Kwangho ; Lee, Manho... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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