Constant, J.
7105  Ergebnisse:
Personensuche X
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1

Drain voltage impact on charge redistribution in GaN-on-Si ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Leurquin, C. ; Vandendaele, W. ; Gwoziecki, R.... - p. 1-6 , 2023
 
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Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Volta..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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10

Role of free holes in nBTI degradation in GaN-on-Si MOS-cha..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Vandendaele, W. ; Jaud, M.-A. ; Viey, A. G.... - p. 345-348 , 2022
 
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Impairment of functional capacity assessed by cardiopulmona..:

Stevant, D. ; Jacob, N. ; Guijarro, D....
Archives of Cardiovascular Diseases Supplements.  13 (2021)  1 - p. 75 , 2021
 
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