E-LIB Suche - Ergebnisse für: Diouf, C.

1

Non-conducting Hot carrier temperature activation and tempe..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Federspiel, X. ; Diouf, C. ; Arunachalam, B... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

2

40-nm RFSOI technology exhibiting 90fs RON × COFF and fT/fM..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),

Cremer, S. ; Pelloux, N. ; Gianesello, F.... - p. 101-104 , 2023

Link: https://doi.org/10.1109/..

3

Insight Into HCI Reliability on I/O Nitrided Devices:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Doyen, C. ; Yon, V. ; Garros, X.... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

4

Modulation Of HCI in I/O analog devices Through Process Spe..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Diouf, C. ; Federspiel, X. ; Bravaix, A.... - p. 1-8 , 2023

Link: https://doi.org/10.1109/..

5

0.13 μm HR SiGe BiCMOS Technology exhibiting 169 fs Ron x C..:

, In: 2022 International Electron Devices Meeting (IEDM),

Gianesello, F. ; Charbuillet, C. ; Derrier, N.... - p. 11.7.1-11.7.4 , 2022

Link: https://doi.org/10.1109/..

6

HCI Temperature sense effect from 180nm to 28nm nodes:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),

Federspiel, X. ; Camara, A. ; Michard, A... - p. 1-5 , 2021

Link: https://doi.org/10.1109/..

7

Comparison of variability of HCI induced drift for SiON and..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Federspiel, X. ; Diouf, C. ; Cacho, F.. - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

8

Robustness analysis of a parallel two-box digital polynomia..:

Diouf, C. ; Younes, M. ; Noaja, A....
Optics Communications. 402 (2017) - p. 442-452 , 2017

Link: https://doi.org/10.1016/..

9

Temporal Narrowing of Neutrons Produced by High-Intensity S..:

Higginson, D. P. ; Vassura, L. ; Gugiu, M. M....
Physical Review Letters. 115 (2015) 5 - p. , 2015

Link: https://doi.org/10.1103/..

10

"Y function" method applied to saturation regime: Apparent ..:

Diouf, C. ; Cros, A. ; Monfray, S....
Solid-State Electronics. 85 (2013) - p. 12-14 , 2013

Link: https://doi.org/10.1016/..

11

Unexpected impact of germanium content in SiGe bulk PMOSFET:

Diouf, C. ; Cros, A. ; Soussou, A....
Solid-State Electronics. 86 (2013) - p. 45-50 , 2013

Link: https://doi.org/10.1016/..

12

Hepatitis B immunization of infants with a reduced number o..:

Yvonnet, B. ; Coursaget, P. ; Deciron, F....
Transactions of the Royal Society of Tropical Medicine and Hygiene. 81 (1987) 1 - p. 165-166 , 1987

Link: https://doi.org/10.1016/..

13

Age‐ and sex‐related study of hepatitis B virus chronic car..:

Coursaget, P. ; Yvonnet, B. ; Chotard, J....
Journal of Medical Virology. 22 (1987) 1 - p. 1-5 , 1987

Link: https://doi.org/10.1002/..

14

Closed loop obstruction: Pictorial essay:

Mbengue, A. ; Ndiaye, A. ; Soko, T.O....
Diagnostic and Interventional Imaging. 96 (2015) 2 - p. 213-220 , 2015

Link: https://doi.org/10.1016/..

15

Acute intestinal ischaemia revealing a metastatic ileal end..:

Mbengue, A. ; Diallo, I. ; Ndiaye, A.R....
Diagnostic and Interventional Imaging. 95 (2014) 11 - p. 1109-1110 , 2014

Link: https://doi.org/10.1016/..