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2020 IEEE 29th Asian Test Symposium (ATS) ,
9
On-chip EOL Prognostics Using Data-Fusion of Embedded Instr..:
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2020 IEEE European Test Symposium (ETS) ,
10
A New Monitor Insertion Algorithm for Intermittent Fault De..:
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2020 IEEE International Symposium on Circuits and Systems (ISCAS) ,
11
On-Chip Embedded Instruments Data Fusion and Life-Time Prog..:
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2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
12
Life-Time Prognostics of Dependable VLSI-SoCs using Machine..:
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2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
13
Analog Test Interface for IEEE 1687 Employing Split SAR Arc..:
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2019 IEEE International Test Conference (ITC) ,
14
DARS: An EDA Framework for Reliability and Functional Safet..:
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2019 IEEE International Test Conference in Asia (ITC-Asia) ,
15