E-LIB Suche - Ergebnisse für: Konijnenburg, Jan

1

Architecture and growth history of a Miocene carbonate plat..:

, In: Phanerozoic Regional Geology of the World,

Zampetti, Valentina ; Schlager, Wolfgang ; Konijnenburg, Jan-Henk van. - p. 512-537 , 2012

2

Architecture and growth history of a Miocene carbonate plat..:

Zampetti, Valentina ; Schlager, Wolfgang ; van Konijnenburg, Jan-Henk.
Marine and Petroleum Geology. 21 (2004) 5 - p. 517-534 , 2004

Link: https://doi.org/10.1016/..

3

Open the box of digital neuromorphic processor: Towards eff..:

, In: 2023 IEEE International Symposium on Circuits and Systems (ISCAS),

Tang, Guangzhi ; Safa, Ali ; Shidqi, Kevin... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

4

SENeCA: Scalable Energy-efficient Neuromorphic Computer Arc..:

, In: 2022 IEEE 4th International Conference on Artificial Intelligence Circuits and Systems (AICAS),

Yousefzadeh, Amirreza ; van Schaik, Gert-Jan ; Tahghighi, Mohammad... - p. 371-374 , 2022

Link: https://doi.org/10.1109/..

5

Reliable and energy-efficient 1MHz 0.4V dynamically reconfi..:

, In: 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers,

Konijnenburg, Mario ; Cho, Yeongojn ; Ashouei, Maryam... - p. 430-431 , 2013

Link: https://doi.org/10.1109/..

6

Contributors for Volumes 1A, 1B and 1C:

, In: Regional Geology and Tectonics: Phanerozoic Passive Margins, Cratonic Basins and Global Tectonic Maps,

Antobreh, A.A. ; Blaich, Olav Antonio ; Artemieva, I.M.... - p. xxvi-xxxviii , 2012

Link: https://doi.org/10.1016/..

7

A DfT Architecture for 3D-SICs Based on a Standardizable Di..:

Marinissen, Erik Jan ; Chi, Chun-Chuan ; Konijnenburg, Mario.
Journal of Electronic Testing. 28 (2011) 1 - p. 73-92 , 2011

Link: https://doi.org/10.1007/..

8

IoT: source of test challenges:

Marinissen, Erik Jan ; Zorian, Yervant ; Konijnenburg, Mario...
Marinissen , E J , Zorian , Y , Konijnenburg , M , Huang , C-T , Hsieh , P-H , Cockburn , P , Delvaux , J , Rozic , V , Yang , B , Singelee , D , Verbauwhede , I , Mayor , C , Van Rijsinge , R & Reyes , C 2016 , IoT: source of test challenges . in Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016 . , 7519331 , Institute of Electrical and Electronics Engineers , Piscataway , 21st IEEE European Test Symposium (ETS 2016) , Amsterdam , Netherlands , 23/05/16 . https://doi.org/10.1109/ETS.2016.7519331. , 2016

Link: https://research.tue.nl/..

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