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2020 IEEE International Reliability Physics Symposium (IRPS) ,
1
Investigating of SER in 28 nm FDSOI-Planar and Comparing wi..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
2
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV..:
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Proceedings of the 2004 Asia and South Pacific Design Automation Conference ,
7