Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Mamy Randriamihaja, Yoann
5  Ergebnisse:
englisch X
Personensuche X
?
1

Microscopic scale characterization and modeling of transist..:

Mamy Randriamihaja, Yoann ; Huard, V. ; Federspiel, X....
Microelectronics Reliability.  52 (2012)  11 - p. 2513-2520 , 2012
Link: https://doi.org/10.1016/..
 
?
2

Comparing defect characterization techniques with non-radia..:

Garetto, Davide ; Randriamihaja, Yoann Mamy ; Rideau, Denis..
Journal of Computational Electronics.  11 (2012)  3 - p. 225-237 , 2012
Link: https://doi.org/10.1007/..
 
?
3

Analysis of defect capture cross sections using non-radiati..:

Garetto, Davide ; Randriamihaja, Yoann Mamy ; Zaka, Alban...
Solid-State Electronics.  71 (2012)  - p. 74-79 , 2012
Link: https://doi.org/10.1016/..
 
?
4

From defects creation to circuit reliability – A bottom-up ..:

Huard, V. ; Cacho, F. ; Mamy Randriamihaja, Y..
Microelectronic Engineering.  88 (2011)  7 - p. 1396-1407 , 2011
Link: https://doi.org/10.1016/..
 
?
5

New Hot Carrier degradation modeling reconsidering the role..:

, In: 2013 IEEE International Reliability Physics Symposium (IRPS),
Randriamihaja, Y. Mamy ; Federspiel, X. ; Huard, V... - p. XT.1.1-XT.1.5 , 2013
Link: https://doi.org/10.1109/..
 
1-5