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Olivo, Piero
93  Ergebnisse:
englisch X
Personensuche X
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1

Experimental verification and benchmark of in-memory princi..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Mannocci, Piergiulio ; Baroni, Andrea ; Melacarne, Enrico... - p. 326-330 , 2022
Link: https://doi.org/10.1109/..
 
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2

End-to-end modeling of variability-aware neural networks ba..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Glukhov, Artem ; Lepri, Nicola ; Milo, Valerio... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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3

Assessing the Role of Program Suspend Operation in 3D NAND ..:

Zambelli, Cristian ; Zuolo, Lorenzo ; Aldarese, Antonio...
Electronics.  10 (2021)  12 - p. 1394 , 2021
Link: https://doi.org/10.3390/..
 
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4

A Scalable Bidimensional Randomization Scheme for TLC 3D NA..:

Favalli, Michele ; Zambelli, Cristian ; Marelli, Alessia..
Micromachines.  12 (2021)  7 - p. 759 , 2021
Link: https://doi.org/10.3390/..
 
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5

Points-Over-Threshold Statistics for Post-Retention Read Di..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),
Zambelli, Cristian ; Crippa, Luca ; Micheloni, Rino. - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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6

Mitigating Self-Heating in Solid State Drives for Industria..:

Zambelli, Cristian ; Zuolo, Lorenzo ; Crippa, Luca..
Electronics.  9 (2020)  7 - p. 1179 , 2020
Link: https://doi.org/10.3390/..
 
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7

Dynamic VTH Tracking for Cross-Temperature Suppression in 3..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Zambelli, Cristian ; Ferro, Enrico ; Crippa, Luca.. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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8

Characterization of the interface-driven 1st Reset operatio..:

Pérez, Eduardo ; Mahadevaiah, Mamathamba Kalishettyhalli ; Zambelli, Cristian..
Solid-State Electronics.  159 (2019)  - p. 51-56 , 2019
Link: https://doi.org/10.1016/..
 
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9

Impact of the precursor chemistry and process conditions on..:

Grossi, Alessandro ; Perez, Eduardo ; Zambelli, Cristian...
Scientific Reports.  8 (2018)  1 - p. , 2018
Link: https://doi.org/10.1038/..
 
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10

Mechanism of the Key Impact of Residual Carbon Content on t..:

Niu, Gang ; Cartoixà, Xavier ; Grossi, Alessandro...
The Journal of Physical Chemistry C.  121 (2017)  12 - p. 7005-7014 , 2017
Link: https://doi.org/10.1021/..
 
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11

Electrical characterization and modeling of 1T-1R RRAM arra..:

Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero...
Solid-State Electronics.  128 (2017)  - p. 187-193 , 2017
Link: https://doi.org/10.1016/..
 
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12

Architectural and Integration Options for 3D NAND Flash Mem..:

Micheloni, Rino ; Crippa, Luca ; Zambelli, Cristian.
Computers.  6 (2017)  3 - p. 27 , 2017
Link: https://doi.org/10.3390/..
 
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13

Electrical characterization and modeling of pulse-based for..:

Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero...
Solid-State Electronics.  115 (2016)  - p. 17-25 , 2016
Link: https://doi.org/10.1016/..
 
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14

Design space exploration of latency and bandwidth in RRAM-b..:

, In: 2015 15th Non-Volatile Memory Technology Symposium (NVMTS),
Zuolo, Lorenzo ; Zambelli, Cristian ; Micheloni, Rino.. - p. 1-4 , 2015
Link: https://doi.org/10.1109/..
 
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15

Performance and Reliability Analysis of Cross-Layer Optimiz..:

Bertozzi, Davide ; Carlo, Stefano Di ; Galfano, Salvatore...
ACM Transactions on Embedded Computing Systems.  14 (2015)  1 - p. 1-24 , 2015
Link: https://doi.org/10.1145/..
 
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