E-LIB Suche - Ergebnisse für: Ramasse, Q

1

Unveiling the atomic position of C in Mn5Ge3Cx thin films:

Michez, L.-A. ; Petit, M. ; Heresanu, V....
Physical Review Materials. 6 (2022) 7 - p. , 2022

Link: https://doi.org/10.1103/..

2

Atomically resolved chemical ordering at the nm-thick TiO p..:

Impagnatiello, A. ; Hernandez-Maldonado, D. ; Bertali, G....
Scripta Materialia. 126 (2017) - p. 50-54 , 2017

Link: https://doi.org/10.1016/..

3

Ion-beam modification of 2-D materials - single implant ato..:

Bangert, U. ; Stewart, A. ; O'Connell, E....
Ultramicroscopy. 176 (2017) - p. 31-36 , 2017

Link: https://doi.org/10.1016/..

4

Interfacial Origin of the Magnetisation Suppression of Thin..:

Mitra, A. ; Cespedes, O. ; Ramasse, Q....
Scientific Reports. 7 (2017) 1 - p. , 2017

Link: https://doi.org/10.1038/..

5

Atomic-level structural and chemical analysis of Cr-doped B..:

Ghasemi, A. ; Kepaptsoglou, D. ; Collins-McIntyre, L. J....
Scientific Reports. 6 (2016) 1 - p. , 2016

Link: https://doi.org/10.1038/..

6

Experimental and density functional study of Mn doped Bi2Te..:

Ghasemi, A. ; Kepaptsoglou, D. ; Figueroa, A. I....
APL Materials. 4 (2016) 12 - p. 126103 , 2016

Link: https://doi.org/10.1063/..

7

Nonstoichiometric Twin Defects in Fe 3 O 4 (111) Thin Films..:

Kepaptsoglou, D. ; Gilks, D. ; Mckeena, K....
Microscopy and Microanalysis. 22 (2016) S3 - p. 1698-1699 , 2016

Link: https://doi.org/10.1017/..

8

HAADF-STEM analysis of the composition distribution in InAl..:

Baladés, N. ; Herrera, M. ; Sales, D. L....
Microscopy and Microanalysis. 22 (2016) S4 - p. 30-31 , 2016

Link: https://doi.org/10.1017/..

9

Ion Implantation of Graphene—Toward IC Compatible Technolog..:

Bangert, U. ; Pierce, W. ; Kepaptsoglou, D. M....
Nano Letters. 13 (2013) 10 - p. 4902-4907 , 2013

Link: https://doi.org/10.1021/..

10

Quantum Confinement in Germanium Quantum Dots Observed by E..:

Nguyen, P.D. ; Kepaptsoglou, D.M. ; Erni, R...
Microscopy and Microanalysis. 19 (2013) S2 - p. 1486-1487 , 2013

Link: https://doi.org/10.1017/..

11

Evidence for a Thickness-Dependent Crossover from Charge- t..:

Spurgeon, S.R. ; Sloppy, J.D. ; Winkler, C.R....
Microscopy and Microanalysis. 19 (2013) S2 - p. 1964-1965 , 2013

Link: https://doi.org/10.1017/..

12

High-Precision Chemical Analysis and Structural Determinati..:

Kepaptsoglou, D.M. ; Azough, F. ; Ramasse, Q....
Microscopy and Microanalysis. 19 (2013) S2 - p. 1918-1919 , 2013

Link: https://doi.org/10.1017/..

13

Dielectric properties of pulsed-laser deposited indium tin ..:

Giusti, G. ; Bowen, J. ; Ramasse, Q....
Thin Solid Films. 524 (2012) - p. 249-256 , 2012

Link: https://doi.org/10.1016/..

14

Examining the structure and bonding in complex oxides using..:

Klie, R. F. ; Qiao, Q. ; Paulauskas, T....
Physical Review B. 85 (2012) 5 - p. , 2012

Link: https://doi.org/10.1103/..

15

SDD-EDS: Element Analysis of Nanostructures in TEM:

Falke, M. ; Kaeppel, A. ; Scheller, S....
Microscopy and Microanalysis. 18 (2012) S2 - p. 1058-1059 , 2012

Link: https://doi.org/10.1017/..