Santos, L. B.
~ 37000  Ergebnisse:
Personensuche X
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2

Comparing Rectangular and ELT MOSFET layouts under TID:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
 
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4

Ionizing Radiation Hardness Characterization of GaN HEMTs D..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Boas, A.C.V. ; Alberton, S.G. ; Medina, N.H.... - p. 1-4 , 2022
 
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7

Heavy-Ion-Induced Avalanche Multiplication in Low-Voltage P..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Alberton, S. G. ; Medina, N. H. ; Added, N.... - p. 1-5 , 2021
 
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8

Assessment of Ionizing Radiation Hardness of a GaN Field-Ef..:

, In: 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro),
 
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9

Radiation Hardness of GaN HEMTs to TID Effects: COTS for ha..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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13

Experimental setup for Single Event Effects at the São Paul..:

Aguiar, V.A.P. ; Added, N. ; Medina, N.H....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  332 (2014)  - p. 397-400 , 2014
 
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15

Comparative study of the proton beam effects between the co..:

Cirne, K. ; Silveira, M.A.G. ; Santos, R.B.B....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  273 (2012)  - p. 80-82 , 2012
 
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