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2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) ,
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Comparing Rectangular and ELT MOSFET layouts under TID:
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2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
4
Ionizing Radiation Hardness Characterization of GaN HEMTs D..:
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2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
7
Heavy-Ion-Induced Avalanche Multiplication in Low-Voltage P..:
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2019 34th Symposium on Microelectronics Technology and Devices (SBMicro) ,
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Assessment of Ionizing Radiation Hardness of a GaN Field-Ef..:
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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
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