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Stroud, Charles E.
540  Ergebnisse:
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1

On Built-In Self-Test for Adders:

Pulukuri, Mary D. ; Stroud, Charles E.
Journal of Electronic Testing.  25 (2009)  6 - p. 343-346 , 2009
Link: https://doi.org/10.1007/..
 
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2

System-on-chip test architectures 

nanometer design for testability  The Morgan Kaufmann series in systems on silicon
Wang, Laung-Terng ; Stroud, Charles E. ; Touba, Nur A. , 2008
Exemplar:  Zentrale:E02 a inf 170 ef/741
 
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3

Field Programmable Gate Array Testing:

, In: System-on-Chip Test Architectures,
Stroud, Charles E. - p. 549-590 , 2008
Link: https://doi.org/10.1016/..
 
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4

Analog and Mixed-Signal Test Architectures:

, In: System-on-Chip Test Architectures,
Foster Dai, F. ; Stroud, Charles E. - p. 703-743 , 2008
Link: https://doi.org/10.1016/..
 
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5

System-on-chip test architectures: nanometer design for tes.. 

The Morgan Kaufmann series in systems on silicon
Wang, Laung-Terng ; Stroud, Charles E ; Touba, Nur A , 2008
Link: https://search.ebscohost..
 
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6

Introduction:

, In: System-on-Chip Test Architectures,
Wang, Laung-Terng (L.-T.) ; Stroud, Charles E. ; Touba, Nur A. - p. 1-40 , 2008
Link: https://doi.org/10.1016/..
 
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7

Multiple error detection and identification via signature a..:

Damarla, T. Raju ; Stroud, Charles E. ; Sathaye, Avinash
Journal of Electronic Testing.  7 (1995)  3 - p. 193-207 , 1995
Link: https://doi.org/10.1007/..
 
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8

A built-in self test scheme for VLSI:

, In: Proceedings of the 1995 Asia and South Pacific Design Automation Conference,
Damarla, T. Raju ; Su, Wei ; Michael, Gerald T... - p. 34-es , 1995
Link: https://dl.acm.org/doi/1..
 
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9

Testability and test generation for majority voting fault-t..:

Stroud, Charles E. ; Barbour, Ahmed E.
Journal of Electronic Testing.  4 (1993)  3 - p. 201-214 , 1993
Link: https://doi.org/10.1007/..
 
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10

Identification of nosean in sodalite and conversion of nose..:

Todd Jr., Lee T. ; Stroud, Charles E. ; Farrell, Eugene F.
Materials Research Bulletin.  15 (1980)  5 - p. 595-605 , 1980
Link: https://doi.org/10.1016/..
 
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11

Psychometric Properties of the Mini International Neuropsyc..:

Korte, Kristina J. ; Jaguga, Florence ; Kim, Hannah H....
Psychological Medicine.  54 (2024)  2 - p. 436-436 , 2024
Link: https://doi.org/10.1017/..
 
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12

Psychometric Properties of the Mini International Neuropsyc..:

Korte, Kristina J. ; Jaguga, Florence ; Kim, Hannah H....
Psychological Medicine.  53 (2023)  15 - p. 7042-7052 , 2023
Link: https://doi.org/10.1017/..
 
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13

Cross-country variations in the reporting of psychotic symp..:

Bitta, Mary ; Thungana, Yanga ; Kim, Hannah H....
Journal of Affective Disorders.  304 (2022)  - p. 85-92 , 2022
Link: https://doi.org/10.1016/..
 
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14

Traumatic experiences assessed with the life events checkli..:

Kwobah, Edith Kamaru ; Misra, Supriya ; Ametaj, Amantia A....
Journal of Affective Disorders.  303 (2022)  - p. 161-167 , 2022
Link: https://doi.org/10.1016/..
 
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15

Measuring psychological distress using the K10 in Kenya:

Ongeri, Linnet ; Ametaj, Amantia ; Kim, Hannah...
Journal of Affective Disorders.  303 (2022)  - p. 155-160 , 2022
Link: https://doi.org/10.1016/..
 
1-15