Picardi, Stefano Maria
1  Ergebnisse:
Personensuche X
?
1

20 nm-Resolved Stress Profile in SiGe Nano-Stripes Obtained..:

, In: Handbook of enhanced spectroscopy / edited by Pietro Giuseppe Gucciardi, Marc Lamy de la Chapelle, Nathalie Lidgi-Guigui
Exemplar:  Zentrale: a phy 765/299
 
1-1