Lee, Ui-Lyong
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An effective and efficient defect inspection system for TFT..:

, In: International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Noh, Chung-ho ; Lee, Seok-lyong ; Kim, Deok-hwan... (2010)  17/18 - p. 5115-5135
Exemplare: Zentrale;
 
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